H. Sawada: Estimation and Correction of Effects of Simultaneous Reflections on Intensity Data Collected with the Four-Circle Diffractometer

Crystal Research and Technology

Cryst. Res. Technol. 35 (2000) 307 - Abstract -

H. Sawada

Department of Applied Chemistry, Kogakuin University, Tokyo, Japan

Estimation and Correction of Effects of Simultaneous Reflections on Intensity Data Collected with the Four-Circle Diffractometer

A procedure based on the kinematical theory has been developed to estimate and correct the effects of simultaneous reflections on intensity data collected with the four-circle single crystal X-ray diffractometer through minimizing the scatter of the corrected structure factor (intensity) values of equivalent reflections.

Keywords: simultaneous reflection, multiple reflection, multiple diffraction, Renninger effect, four-circle diffractometer, X-ray diffraction

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