The microscopic theory for the coefficient of longitudinal tensosensibility of multi-layer polycrystalline metal films has been developed. The theory takes into consideration as the scattering of conductivity electrons on external and internal surfaces of separate layers and crystalline boundaries, so as the dependence of specular reflection coefficient and coefficient of transmission of crystalline boundaries and boundaries between separate layers on deformation. The experimental verification of the theory done on three-layer film systems Cr/Co/Cr, Cr/Cu/Cr and Ni/Co/Cr given as the quality correspondence.

Keywords: theory, tensosensibility, multi-layer, films

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