A.-T. Tham, D. S. Su , W. Neumann, P. Schubert-Bischoff, C. Beilharz, K. W. Benz: Transmission Electron Microscopical Studies of the Layered Structure of the Ternary Semiconductor CuIn<SUB>5</SUB>Se<SUB>8</SUB>

Crystal Research and Technology

Cryst. Res. Technol. 36 (2001) 303 - Abstract -

A.-T. Tham, D. S. Su* , W. Neumann, P. Schubert-Bischoff**, C. Beilharz***, K. W. Benz***

Humboldt University of Berlin, Germany
*Fritz Haber Institute of the Max Planck Society, Germany
**Hahn Meitner Institute Berlin GmbH, Germany
***University of Freiburg, Germany

Transmission Electron Microscopical Studies of the Layered Structure of the Ternary Semiconductor CuIn₅Se₈

The structure of the off-stoichiometric In-rich ternary phase CuIn5Se8 was studied by means of electron diffraction and high-resolution electron microscopy. The compound shows a layered structure with a 7-layer stacking sequence of closed-packed planes, which contains both cubic and hexagonal stacking of Se atoms. The studied CuIn₅Se₈ bulk crystal is known as the β -phase of this compound.

Keywords: TEM, CuInSe, layer

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