| Crystal Research and Technology |
We describe the manufacturing and testing of a monolithic perfect crystal interferometer with very thin lamellae, optimized for neutron phase contrast imaging where high spatial phase resolution is required. The two main characteristics of our new interferometer design are thin lamellae (t = 0.56 mm) for beam splitter S and analyzer A, and mirrors M1, M2 of twice the thickness (tM = 1.12 mm) of S and A. The different stages of crystal preparation and the successful test with X-rays are reported.
Keywords: microtomography, phase contrast, neutron and X-ray interferometry, perfect crystals, dynamical X-ray diffraction