X. N. Jiang, D. Xu, D. R. Yuan, D. L. Sun, M. K. Lu, G. H. Zhang, S. Y. Guo: Atomic Force Microscopy Studies on Growth Mechanisms and Defect Formations on {110} Faces of Cadmium Mercury Thiocyanate Crystals

Crystal Research and Technology

Cryst. Res. Technol. 36 (2001) 601 - Abstract -

X. N. Jiang, D. Xu, D. R. Yuan, D. L. Sun, M. K. Lu, G. H. Zhang, S. Y. Guo

State Key Laboratory of Crystal Materials, Institute of Crystal Materials, Shandong University, Jinan, People’s Republic of China

Atomic Force Microscopy Studies on Growth Mechanisms and Defect Formations on {110} Faces of Cadmium Mercury Thiocyanate Crystals

Growth mechanisms and defect formations on {110} faces of cadmium mercury thiocyanate crystals grown at 30°C (σ = 0.24)were investigated by using atomic force microscopy (AFM). It was found that, under this condition, spiral dislocation controlled mechanism and 2D nucleation mechanism operates simultaneously and equally during growth, which is completely different from the traditional 2D nucleation and dislocation source controlled mechanisms. A number of 2D nucleus are formed at the large step terraces generated by dislocation sources, leading to the unequal growth rates of the elementary steps and thereby “step bunches” are caused. Various defects are formed under this growth condition, which is assumed to result from the incongruence between the steps generated by different sources. A new kind of 2D defect, corresponding to one growth layer in height, was observed for the first time.

Keywords: atomic force microscopy, cadmium mercury thiocyanate crystals, growth mechanisms, single-layered defects, three-dimensional defects

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