Crystal Research and Technology
Cryst. Res. Technol. 36 (2001) 1045 - Abstract -

H. W. Kunert, E. Lavitska*

Department of Physics, University of Pretoria, South Africa
*Department of Semiconductor Electronics, Lviv Polytechnic University, Ukraine

Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers

The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra-thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.

Keywords: stress, strain, overlayer, stiffness constants



The full text of this paper in pdf-Format:

If you came directly to this page, click this symbol to go to the homepage of CRT.