Crystal Research and Technology
Cryst. Res. Technol. 36 (2001) 1119 - Abstract -

E. Talik, A. Winiarski, B. Kotur*, W. Suski**

Institute of Physics, University of Silesia, Katowice, Poland
*Ivan Franko National University of Lviv, Ukraine
**W. Trzebiatowski Institute of Low Temperature and Structure Research, Polish Academy of Sciences Wroclaw, Poland

Growth and X –Ray Characterization of ScFe4Al8 Single Crystals

Single crystals of the ScFe4Al8 intermetallic compound were obtained by the Czochralski method from a levitated melt. The X–ray powder diffraction, Laue and Berg–Barrett reflection topographies exhibit that the obtained single crystals were a good quality. The lattice parameters a = 8.652 ∓ 0.004 Å, c = 5.020 ∓ 0.003 Å were calculated from powder diffraction patterns.

Keywords: intermetallic compound, single crystal growth, X-ray topography


The full text of this paper in pdf-Format:

If you came directly to this page, click this symbol to go to the homepage of CRT.