Y. Epelboin , B. Capelle: Analysis of the Contrast of Piezoelectric Devices in Synchrotron Stroboscopic Section Topographs

Crystal Research and Technology

Cryst. Res. Technol. 37 (2002) 676 - Abstract -

Y. Epelboin , B. Capelle

LMCP, UMR 7590 CNRS, case 115, Université P.M. Curie and D. Diderot, 75252 Paris Cedex 05, France

Analysis of the Contrast of Piezoelectric Devices in Synchrotron Stroboscopic Section Topographs

Stroboscopic sections topographs of vibrating piezoelectric devices have been recorded at station ID19 at ESRF. The drastic changes in the contrast of the images as a function of the distance between the crystal and the film can be explained by means of the dynamical theory for short distances and simulations confirm it. For long distances a kinematical approach permits to satisfactory explain the shape of the image.

Keywords: x-ray topography, dynamical theory, piezoelectricity

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