S. Lagomarsino, A. Cedola, S. Di Fonzo, W. Jark, V. Mocella, J. B. Pelka, C. Riekel: Advances in Microdiffraction with X-Ray Waveguide

Crystal Research and Technology

Cryst. Res. Technol. 37 (2002) 758 - Abstract -

S. Lagomarsino, A. Cedola, S. Di Fonzo***, W. Jark***, V. Mocella*, J. B. Pelka**, C. Riekel****

Istituto di Fotonica e Nanotecnologie (IFN) - CNR - V. Cineto Romano 42, 00156 Roma,Italy
*CNR - Istituto per il Rilevamento Elettromagnetico dell'Ambiente via Diocleziano 328 - 80124 Napoli - Italy
**Institute of Physics, Polish Academy of Sciences; Al. Lotnikow 32/46, 02-668 Warsaw, Poland
***Sincrotrone Trieste - S.S.14 Km 163,5, in Area Science Park, 34012 Basovizza - Trieste, Italy
****European Synchrotron Radiation Facility - B.P. 220, F-38043 Grenoble Cedex, France

Advances in Microdiffraction with X-Ray Waveguide

The x-ray waveguides are a novel optical component for hard x-rays able to produce submicrometer beams. In this article we review the operating principle and describe the characteristics of the exiting beam. We will give two significant examples of applications in microdiffraction obtained with an unprecedented spatial resolution of 100 nm.

Keywords: x-ray, microscopy, synchrotron radiation, diffraction, fibres, strain

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