Crystal Research and Technology
Cryst. Res. Technol. 37 (2002) 1241 - Abstract -

D. Pathinettam Padiyan, A. Marikani*

Department of Physics, Manonmaniam Sundaranar University, Tirunelveli- 627012, India
*Mepco Schlenk Engineering College, Virudhunagar-Dt 626 005, India

X-ray Determination of Lattice Constants of CdxSn1-xSe Mixed Crystal Systems

CdxSn1-xSe with x = 0, 0.25, 0.3, 0.5, 0.75 and 1 are synthesized by melt technique and are found to be polycrystalline in nature. The X-ray powder diffraction data of polycrystalline CdxSn1-xSe with x = 0, 0.25, 0.3, 0.5, 0.75 and 1 are analysed at room temperature and reported. The XRD peaks are indexed using DICVOL91 and cell constants are refined using the software UNITCELL. The powder diffraction patterns, lattice parameters and other data describing these compounds are presented in this paper.

Keywords: powder diffraction, cadmium selenide, CdxSn1-xSe, tin selenide


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