A comparison of the KOSSEL and the X-ray Rotation-Tilt Technique by J. Bauch, H.-J. Ullrich, M. Böhling, D. Reiche

Crystal Research and Technology

Cryst. Res. Technol. 38, 440 (2003) - Abstract -

A comparison of the KOSSEL and the X-ray Rotation-Tilt Technique

J. Bauch, H.-J. Ullrich, M. Böhling, D. Reiche

TU Dresden, Institut für Werkstoffwissenschaft, 01062 Dresden, Germany

Keywords X-ray microdiffraction, KOSSEL technique, X-ray rotation-tilt technique (XRT), synchrotron radiation, determination of lattice parameters, stress

There are world-wide efforts to analyse micron regions of compact samples by means of X-ray diffraction (“X-ray Microdiffraction”). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X-ray Rotation-Tilt Method (XRT), are compared to show their possibilities and limitations. Some selected examples of new applications are presented.

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