Crystal Research and Technology
Cryst. Res. Technol. 38, 979 (2003) - Abstract -

Optical characterization of thermally evaporated thin CdO films

A. A. Dakhel and F. Z. Henari

Physics Department, College of Science, University of Bahrain, Isa town, PO Box 32038, Bahrain

Keywords cadmium oxide thin films, thermal evaporation, x-ray, wide ban gap, optical properties, optical non-linearity, optical limiting, z-scan
PACS 61.10.NZ, 78.20.-e, 61.10.-i, 42.70.Mp, 78.20.-e
DOI 10.1002/crat.200310124

Cadmium Oxide films have been prepared by vacuum evaporation method on a glass substrate at room temperature. Detailed structural, optical, and electrical properties of the films are presented at different annealing temperatures. The crystal structure of the samples was studied by X- ray diffraction. The spectral absorption coefficient of the CdO film at the fundamental absorption region (450-650nm) was determined using the spectral data of transmittance. The direct and indirect band gap energies were determined and found to be 2.33 eV and 1.95 eV respectively. The third order optical nonlinearities X(3) of CdO films has been measured used the z-can technique. The real and imaginary parts of X(3) have been measured at 514 nm and found to be 1.7x10-3 esu and 3.0x10-3 esu, respectively.



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