Misleading fringes in TEM images and diffraction patterns of Si nanocrystallites by Hideo Kohno, Nobuhiko Ozaki, Hideto Yoshida, Koji Tanaka, and Seiji Takeda

Crystal Research and Technology

Cryst. Res. Technol. 38, 1082 (2003) - Abstract -

Misleading fringes in TEM images and diffraction patterns of Si nanocrystallites

Hideo Kohno, Nobuhiko Ozaki, Hideto Yoshida, Koji Tanaka*, and Seiji Takeda

Department of Physics, Graduate School of Science, Osaka University, 1-16 Machikaneyama, Toyonaka, Osaka 560-0043, Japan
*Interface Science Research Group, AIST-KANSAI, 1-8-31 Midorioka, Ikeda, Osaka 563-8577, Japan

Keywords	twinned silicon nanocrystallites, electron diffraction pattern, high-resolution electron microscopy, image simulation
PACS	61.72.Mm, 68.37.Lp, 81.07.Bc
DOI	10.1002/crat.200310140

High-resolution transmission electron microscopy (HRTEM) images and electron diffraction patterns of twinned Si nanocrystallites were recorded along various directions and analyzed in detail. We point out that special attention must be paid when interpreting HRTEM images and diffraction patterns of twinned Si nanocrystallites, because elongation of reciprocal lattice points could fabricate misleading fringes and patterns.

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