Crystal Research and Technology
Cryst. Res. Technol. 39, 328 (2004) - Abstract -

Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy

M. Sridharan, M. Mekaladevi*, Sa. K. Narayandass*, D. Mangalaraj*, and Hee Chul Lee**

Grup de Fisica dels Materials I, Department de Fisica, Universitat Autonoma de Barcelona, 08193- Bellaterra, Barcelona. Spain
*Thin Film Laboratory, Department of Physics, Bharathiar University, Coimbatore – 641 046. India
**Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Taejon – 305 701, Korea

Keywords Cd0.9Zn0.1Te films, vacuum evaporation, RBS, XRD, AFM, Raman scattering
PACS 81.10.-h
DOI 10.1002/crat.200310190

Cd0.9Zn0.1Te thin films were prepared by vacuum evaporation onto well-cleaned glass substrates maintained at 300, 373 and 473 K. X-ray diffraction studies revealed that the films have zinc blende structure with preferential (111) orientation. Raman peak of the room temperature deposited film appeared at 140.30 cm-1 and 159.65 cm-1 were for the transverse optic (TO) and longitudinal optic (LO) phonons respectively. The XRD patterns of the higher substrate temperature deposited films exhibited an improvement in the crystallinity of the films. The Raman peak intensity increases and the FWHM decreases for the films deposited at higher substrate temperature.



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