Improved approaches to the determination of residual stresses in micro regions with the KOSSEL and the XRT technique by J. Bauch, St. Wege, M. Böhling, and H.-J. Ullrich

Crystal Research and Technology

Cryst. Res. Technol. 39, 623 (2004) - Abstract -

Improved approaches to the determination of residual stresses in micro regions with the KOSSEL and the XRT technique

J. Bauch, St. Wege, M. Böhling, and H.-J. Ullrich

TU Dresden, Institut für Werkstoffwissenschaft, 01062 Dresden, Germany

Keywords	X-ray microdiffraction, KOSSEL technique, XRT technique, determination of lattice parameters, determination of residual stress, strain
PACS	61.10.-I, 07.85.Jy
DOI	10.1002/crat.200310234

A new application of the KOSSEL and the XRT (X-ray Rotation-Tilt) technique arises from local residual stress measurements in micro regions. Already in 1996/97, we started to conduct such investigations based on the KOSSEL method. Because of the high lateral resolution residual stresses of the third kind can be determined. Some further evaluation procedures are described.

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