Growth and characterization of La3Ga5.5Ta0.5O14 crystal by Haikuan Kong, Jiyang Wang, Huaijin Zhang, Xin Yin, Xiufeng Cheng, Yanting Lin, Xiaobo Hu, Xiangang Xu, and Minhua Jiang

Crystal Research and Technology

Cryst. Res. Technol. 39, 686 (2004) - Abstract -

Growth and characterization of La₃Ga_5.5Ta_0.5O₁₄ crystal

Haikuan Kong, Jiyang Wang, Huaijin Zhang, Xin Yin, Xiufeng Cheng, Yanting Lin, Xiaobo Hu, Xiangang Xu, and Minhua Jiang

State Key Laboratory of Crystal Materials, Shandong University, Jinan, 250100, P.R. China

Keywords	La₃Ga_5.5Ta_0.5O₁₄, Czochralski method, spectra, electrooptic Q-switch
PACS	65.40.De, 78.20.Ci, 78.20.Jq
DOI	10.1002/crat.200310239

La₃Ga_5.5Ta_0.5O₁₄ (LGT) crystal was grown by using the Czochralski method. The as-grown crystal is transparent, free from inclusions and with no cracks. Specific heat, thermal expansion, dielectric constants, transmission spectrum and optical damage threshold of LGT have been measured, and the results show general properties of LGT are similar to that of La₃Ga₅SiO₁₄ (LGS) crystal. The experiment to research the Q-switch properties of LGT has been performed and the results show LGT possesses smaller electrooptic coefficients than that of LGS and may not be an ideal material used as a Q-switch.

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