X-ray powder diffraction study of the semiconducting alloy Cu2Cd0.5Mn0.5GeSe4 by G. E. Delgado, E. Quintero, R. Tovar, and M. Quintero

Crystal Research and Technology

Cryst. Res. Technol. 39, 807 (2004) - Abstract -

X-ray powder diffraction study of the semiconducting alloy Cu₂Cd_0.5Mn_0.5GeSe₄

G. E. Delgado, E. Quintero*, R. Tovar*, and M. Quintero*

Laboratorio de Cristalografía, Departamento de Química, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
*Centro de Estudios de Semiconductores, Departamento de Física, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela

Keywords	semiconductor, crystal structure, X-ray powder diffraction, Rietveld refinement
PACS	61.10.Nz, 61.50.Nw, 61.66.Fn
DOI	10.1002/crat.200310257

The structure of the semiconducting alloy Cu₂Cd_0.5Mn_0.5GeSe₄ was refined from an X-ray powder diffraction pattern using the Rietveld method. The present alloy crystallizes in the wurtz-stannite structure, space group Pmn2₁ (Nº 31), and unit cell parameters values of a = 8.0253(2) Å, b = 6.8591(2) Å, c = 6.5734(2) Å and V = 361.84(2) Å³. The structure exhibits a three-dimensional arrangement of slightly distorted CuSe₄, Cd(Mn)Se₄, and GeSe₄ tetrahedras connected by corners.

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