Crystal Research and Technology
Cryst. Res. Technol. 39, 864 (2004) - Abstract -

Characterization of a crystal grown from Ocimum Basilicum leaves and branches

R. J. C. Lima, A. J. D. Moreno, E. M. Diniz, R. S. G. Oléa*, J. M. Sasaki**, J. Mendes Filho**, P. T. C. Freire**, F. M. Pontes***, E. R. Leite***, and E. Longo***

Laboratório de Crescimento e Caracterização de Cristais, Departamento de Física, Universidade Federal do Maranhão, Av. dos Portugueses s/n, CEP 65080-040, São Luís, Maranhão, Brazil
*Laboratório de Produtos Naturais, Departamento de Química, Universidade Federal do Maranhão, Av. dos Portugueses s/n, CEP 65080-040, São Luís, Maranhão, Brazil
**Laboratório de Crescimento e Caracterização de Cristais, Departamento de Física, Universidade Federal do Ceará, C.P. 6030, Fortaleza, Ceará, 60455-970, Brazil
***LIEC-CMDMC, Departamento de Química, Universidade Federal de São Carlos, CP 676, São Carlos, São Paulo, 13565-905, Brazil

Keywords Ocimum Basilium, crystal growth, X-ray diffraction, FT-Raman
PACS 61.10.Nz, 61.66.Hg
DOI 10.1002/crat.200410267

Leaves and branches of Ocimum Basilicum were dried, reduced to coarse powder and extracted in aqueous metanol and aqueous hexane. This paper discusses the X-ray diffraction and FT-Raman spectra measured at room temperature. The data obtained have been used to propose a general assignment of the vibrational fundamentals on the base of frequencies assigned in other related single crystals. From the results we can conclude that the crystal has a high symmetry.





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