Crystal Research and Technology
Cryst. Res. Technol. 39, 980 (2004) - Abstract -

Zinc oxide – analogue of GaN with new perspective possibilities

V. A. Karpina, V. I. Lazorenko, C. V. Lashkarev, V. D. Dobrowolski, L. I. Kopylova, V. A. Baturin*, S. A. Pustovoytov*, A. Ju. Karpenko*, S. A. Eremin*, P. M. Lytvyn**, V. P. Ovsyannikov***, and E. A. Mazurenko***

Institute for Problems of Material Science, National Academy of Sciences of Ukraine, 3, Krzhyzhanovsky str., Kyiv, 03142, Ukraine
*Institute of Applied Physics, National Academy of Sciences of Ukraine, 40034, 58 Petropavlowska str., Sumy, Ukraine
**Institute for Semiconductor Physics, National Academy of Sciences of Ukraine, 45 Nauka Ave., Kyiv, 03028, Ukraine
***Institute of General and Nonorganic Chemistry, National Academy of Sciences of Ukraine, 32/34 pr. Academika Palladina, Kyiv, 03142, Ukraine

Keywords ZnO, random laser, PEMOCVD, magnetron sputtering
PACS 81.10.-h
DOI 10.1002/crat.200310283

Zinc oxide due to specific electrical, optical and acoustic properties is the important semiconductor material, which has many various applications. There is growing interest in ZnO due to its potential applicability for optoelectronic devices such as light-emitting diodes, laser diodes and detectors for UV wavelength range. ZnO properties are very close to those of widely recognized semiconductor GaN. The band gap of ZnO (3.37 eV) is close to that of GaN (3.39 eV) but ZnO exciton binding energy (60 meV) is twice larger than that of GaN (28 meV). Optically pumped UV lasing have been demonstrated at room temperature using high textured ZnO films. The excitonic gain close to 300 cm-1 was achieved. ZnO thin films are expected to have higher quantum efficiency in UV semiconductor laser than GaN. The physical properties of ZnO are considered. PEMOCVD technology was used to deposit piezoelectric and highly transparent electroconductive ZnO films. Their properties are discussed. The experiments on polycrystalline ZnO films deposited by RF magnetron sputtering at different partial pressure of oxygen are presented. AFM images were studied in tapping mode for deposited films. The investigated films were dielectric ones and had optical transparency within 65-85% at thickness in the interval 0.2-0.6 ìm.





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