X-ray photoelectron spectroscopy investigations of Y3Al5O12:Yb single crystal by M. Kruczek, E. Talik, H. Sakowska, M. Gala, and M. Swirkowicz

Crystal Research and Technology

Cryst. Res. Technol. 40, 440 (2005) - Abstract -

X-ray photoelectron spectroscopy investigations of Y₃Al₅O₁₂:Yb single crystal

M. Kruczek, E. Talik, H. Sakowska*, M. Gala*, and M. Swirkowicz*

Institute of Physics, University of Silesia, 4 Uniwersytecka Str., 40-007 Katowice, Poland
*Institute of Electronic Materials Technology, 133 Wólczyńska Str., 01-919 Warsaw, Poland

Keywords	characterization, surface structure, Czochralski method
PACS	33.60.Fy, 33.70.Jg, 79.60.-i, 79.60.Bm
DOI	10.1002/crat.200410363

X-ray photoelectron spectroscopy was used to study the chemical composition and electronic structure of the Y₃Al₅O₁₂:Yb (YAG:Yb) crystals. The contamination of the crystal with carbon and oxygen in the broken under UHV sample was found. The dopant concentration of Yb, in the mixed valence state, was determined as 12%. The aluminium concentration is lower than a nominal value. The chemical shift analysis shows more ionic bond of Y-O than Al-O.

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