Crystal Research and Technology
Cryst. Res. Technol. 40, 1139 (2005) - Abstract -

Effect of annealing temperature on the structural and optical properties of amorphous Sb2Te2Se thin films

E. A. El-Sayad and G. B. Sakr*

Physics Department, National Research Center, Dokki, Cairo, Egypt
*Physics Department, Faculty of Education, Ain Shams Univ., Cairo, Egypt

Keywords semiconductors, x-ray powder diffraction, composition and phase identification, amorphous films, phase transition, optical properties
PACS 61.10.Nz, 61.50.Nw, 61.66.Fn, 68.55.Nq, 78.66.Li
DOI 10.1002/crat.200410506

Thin films of Sb2Te2Se were prepared by conventional thermal evaporation of the presynthesized material on Corning glass substrates. The chemical composition of the samples was determined by means of energy-dispersive X-ray spectrometry. X-ray diffraction studies on the as-deposited and annealed films revealed an amorphous-to-crystalline phase transition. The as-deposited and annealed films at Ta = 323 and 373 K are amorphous, while those annealed at Ta




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