Synthesis and X-ray powder diffraction studies of semiconducting alloys in the system AgCd2-xZnxGaS4 by O. V. Parasyuk, I. D. Olekseyuk, O. A. Dzham, and V. I. Pekhnyo

Crystal Research and Technology

Cryst. Res. Technol. 41, 32 (2006) - Abstract -

Synthesis and X-ray powder diffraction studies of semiconducting alloys in the system AgCd_2-xZn_xGaS₄

O. V. Parasyuk, I. D. Olekseyuk, O. A. Dzham, and V. I. Pekhnyo*

Department of General and Inorganic Chemistry, Volyn State University, Voli Ave 13, 43009 Lutsk, Ukraine
*V. I. Vernadskii Institute of General and Inorganic Chemistry of the Ukrainian National Academy of Sciences, Palladina Ave 32-34, 03680 Kyiv, Ukraine

Keywords	semiconductor, crystal structure, X-ray powder diffraction
PACS	61.10.Nz, 61.50.Nw, 61.66.Fn
DOI	10.1002/crat.200410525

X-ray powder technique was used in the investigation of AgCd₂GaS₄ ЦСAgZn₂GaS₄Т section to determine the region of AgCd₂GaS₄-based solubility. It was established that the solid solution forms up to 75 mol.% СAgZn₂GaS₄Т. The refinement of AgCd_0.5Zn_1.5GaS₄ structure was performed. This alloy crystallizes in orthorhombic structure (space group Pmn2₁) with unit cell parameters a=0.78772(2), b=0.67221(2), c=0.64019(2) nm, V=0.33899(3) nm³.

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