Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples by B. C. Mohanty and S. Kasiviswanathan

Crystal Research and Technology

Cryst. Res. Technol. 41, 59 (2006) - Abstract -

Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag₂Te films formed from Ag-Te thin film couples

B. C. Mohanty and S. Kasiviswanathan

Department of Physics, Indian Institute of Technology Madras, Chennai 600 036, India

Keywords	thin films, Ag₂Te, TEM, RBS
PACS	68.55.-a, 68.37.Lp
DOI	10.1002/crat.200410530

Formation of Ag₂Te thin films from room temperature (300 K) solid state reaction of Ag and Te thin film couples is investigated. Rutherford Backscattering Spectrometry (RBS) studies confirmed the complete miscibility of the couples and the stoichiometry of the resulting Ag₂Te. Structural analysis by Transmission Electron Microscopy (TEM) showed a fine-grained structure with monoclinic and orthorhombic phases. Annealing at high temperatures resulted in the growth of giant crystallites with monoclinic phase at random sites.

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