Conductivity and temperature coefficient of resistance of multilayered polycrystalline films by A. Chornous, L. Dekhtyaruk, M. Marszalek, and I. Protsenko

Crystal Research and Technology

Cryst. Res. Technol. 41, 388 (2006) - Abstract -

Conductivity and temperature coefficient of resistance of multilayered polycrystalline films

A. Chornous, L. Dekhtyaruk, M. Marszalek*, and I. Protsenko

Sumy State University, R. Corsakova, 2, 40007, Sumy, Ukraine
*The Henryk Niewodnichanski Institute of Nuclear Physics PAN, Radzikovskiego, 152, 31-342 Krakov, Poland

Keywords	multilayered films, conductivity, temperature coefficient of resistance, Mayadas – Shatzkes model, grain boundary, transport phenomena
PACS	68.55.Jk, 72.15.Eb, 72.15.Lh, 72.15.Qm
DOI	10.1002/crat.200510592

We calculate the electric conductivity and the temperature coefficient of resistance (TCR) of a multilayered film consisting of the alternating polycrystalline metal layers of different thickness and purity within the relaxation time formalism. In the case of Cr, Cu and Co-based multilayered films we perform verification of our analytical formulas and demonstrate a qualitative agreement between the theoretically calculated values of the TCR and experiment.

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