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Crystal Research and Technology |
Cryst. Res. Technol. 41, 636 (2006) - Abstract -
Global simulation of a Czochralski furnace for silicon crystal growth against the assumed thermophysical properties
Y. R. Li, C. J. Yu, S. Y. Wu, L. Peng, and N. Imaishi*
College of Power Engineering, Chongqing University, Chongqing 400044, China
*Institute for Materials Chemistry and Engineering, Kyushu University, Fukuoka 816-8580, Japan
| Keywords | computer simulation, finite element method, Czochralski method, silicon, thermophysical properties |
| PACS | 81.10.Aj, 81.10.Fq, 47.15-x, 44.35.+c, 02.70.Dh |
| DOI | 10.1002/crat.200510642 |
In order to understand the effects of the thermophysical properties of the melt on the transport phenomena in the Czochralski (Cz) furnace for the single crystal growth of silicon, a set of global analyses of momentum, heat and mass transfer in small Cz furnace (crucible diameter: 7.2 cm, crystal diameter: 3.5 cm, operated in a 10 Torr argon flow environment) was carried out using the finite-element method. The global analysis assumed a pseudosteady axisymmetric state with laminar flow. The results show that different thermophysical properties will bring different variations of the heater power, the deflection of the melt/crystal interface, the axial temperature gradient in the crystal on the center of the melt/crystal interface and the average oxygen concentration along the melt/crystal interface. The application of the axial magnetic field is insensitive to this effect. This analysis reveals the importance of the determination of the thermophysical property in numerical simulation.

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