Growth and characterisation of Zn:LiNbO3/Mg:LiNbO3 multilayer thin films grown by liquid phase epitaxy by H. J. Lee, T. I. Shin, J. W. Shur, and D. H. Yoon

Crystal Research and Technology

Cryst. Res. Technol. 41, 848 (2006) - Abstract -

Growth and characterisation of Zn:LiNbO₃/Mg:LiNbO₃ multilayer thin films grown by liquid phase epitaxy

H. J. Lee, T. I. Shin, J. W. Shur, and D. H. Yoon

Department of Advanced Materials Engineering, Sungkyunkwan University, Suwon, 440-746, Korea

Keywords	LiNbO3, photorefractive effect, epitaxial layer, LPE method
PACS	78.20.-e, 42.70.-a
DOI	10.1002/crat.200510682

1, 3 and 5 mol% ZnO doped LiNbO₃ film and 2 mol% MgO doped LiNbO₃ multilayer films were grown on the LiNbO₃ (001) substrate by liquid phase epitaxy (LPE) method with a Li₂O-V₂O₅ system. We examined the optical transmission spectra of the Zn:LiNbO₃ by Fourier Transform-Infrared Spectrophotometer (FT-IR). The crystallinity and the lattice mismatch between the Zn:LiNbO₃ film and Mg:LiNbO₃ film was confirmed by x-ray rocking curve (XRC) and observed the ZnO and MgO distribution in the cross-section of the multilayer thin films by electron probe micro analyzer (EPMA). Furthermore, the surface morphology of the films was observed using atomic force microscopy (AFM).

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