Dielectric relaxation in ferroelectric TlInS2 layered crystals within metastable chaotic state by E. Sentürk, L. Tümbek, F. A. Mikailov, and F. Salehli

Crystal Research and Technology

Cryst. Res. Technol. 42, 626 (2007) - Abstract -

Dielectric relaxation in ferroelectric TlInS₂ layered crystals within metastable chaotic state

E. Sentürk, L. Tümbek*, F. A. Mikailov*, and F. Salehli**

Department of Physics, Sakarya University, 54100, Sakarya, Turkey
*Department of Physics, Gebze Institute of Technology, Gebze, 41400, Kocaeli, Turkey
*Department of Physics, Istanbul Technical University, 80626 Maslak, Istanbul, Turkey

Keywords	dielectric constant, layered system, relaxation, chaotic state
PACS	77.22.-d, 77.22.Gm, 77.22.Ch
DOI	10.1002/crat.200610875

The results of investigations low frequency dielectric relaxation in layered ferroelectric TlInS₂ crystals are presented. The measurements were performed in the temperature range of 180-230 K and in the frequency range of 5 kHz–1 MHz. Two different relaxation processes were observed in mentioned temperature interval. The crystal has “slow” and “fast” relaxation mechanisms in low and high frequency region, respectively. The presence of two different relaxation mechanisms in TlInS₂ is discussed.

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