Crystal Research and Technology
Cryst. Res. Technol. 42, 807 (2007) - Abstract -

Crystal data and some physical properties of Tl2InGaTe4 crystals

A. F. Qasrawi and N. M. Gasanly*

Department of Electrical and Electronics Engineering, Atilim University, 06836 Ankara, Turkey
*Department of Physics, Middle East Technical University, 06531 Ankara, Turkey

Keywords X-ray diffraction, resistivity, mobility, photoconductivity, electronic transport
PACS 71.23.An, 71.55.Cn, 72.10.Di, 72.20.Dp, 72.20.Nr
DOI 10.1002/crat.200710909

The room temperature crystal data, Debye temperature, dark and photoelectrical properties of the Bridgman method grown Tl2InGaTe4 crystals are reported for the first time. The X-ray diffraction technique has revealed that Tl2InGaTe4 is a single phase crystal of tetragonal body-centered structure belonging to the I4mcm space group. A Debye temperature of 124 K is calculated from the results of the X-ray data. The current-voltage measurements have shown the existence of the switching property of the crystals at a critical voltage of 80 V. The dark electrical resistivity and Hall effect measurements indicated the n-type conduction. The photosensitivity measurements on the crystal revealed that, the variation of photocurrent with illumination intensity is linear, indicating the domination of monomolecular recombination at room temperature. Moreover, the spectral distribution of the photocurrent allowed the determination of the energy band gap of the crystal studied as 0.88 eV.





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