Crystal Research and Technology
Cryst. Res. Technol. 42, 817 (2007) - Abstract -

Structural, optical and electrical characterization of HgxCd1-xTe polycrystalline films fabricated by two-source evaporation technique

M. Basharat, M. A. Hannan, N. A. Shah, A. Ali, M. Arif, and A. Maqsood

Thermal Physics Laboratory, Department of Physics, Quaid-i-Azam University, Islamabad 45320, Pakistan

Keywords thin film, energy gap, HgCdTe
PACS 68.60.-p, 78.66.Hf
DOI 10.1002/crat.200710911

Two-source thermal evaporation technique was used to prepare HgxCd1-xTe thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500-2700 nm) were used to calculate optical constants. The analysis of the optical absorption data showed that the optical band gap was of indirect type. In the composition range 0.05 < x < 0.25 the films exhibited an optical band gap between 1.29 and 0.98 eV. In the same composition range the films were p-type and exhibited a resistivity, which varied.




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