XPS characterization of YAlO3:Co single crystals by E. Talik, M. Kruczek, W. Zarek, J. Kusz, K. Wójcik, H. Sakowska, and W. Szyrski

Crystal Research and Technology

Cryst. Res. Technol. 42, 1341 (2007) - Abstract -

XPS characterization of YAlO₃:Co single crystals

E. Talik, M. Kruczek, W. Zarek, J. Kusz, K. Wójcik, H. Sakowska*, and W. Szyrski*

Institute of Physics, University of Silesia, ul. Uniwersytecka 4, 40-007 Katowice, Poland
*Institute of Electronic Materials Technology, ul. Wólczyńska 133, 01-919 Warsaw, Poland

Keywords	characterization, surface structure, Czochralski method
PACS	33.60.Fy, 33.70.Jg, 79.60.-i, 79.60.Bm
DOI	10.1002/crat.200711029

YAlO₃:Co (YAP:Co) single crystals have been obtained by the Czochralski method. The XPS spectra of YAP:Co annealed in reducing atmospheres: H₂, vacuum and vacuum plus H₂ are presented and discussed. As confirmed by magnetic measurements and the electron spectroscopy XPS the dopant concentration of Co is lower than a nominal one. The annealing processes removed colour centers due to relocation and some reduction of oxygen ions in the structure. The increased unit volume during the long annealing process may be caused by the change in some Co³⁺ ions into Co²⁺ ions. This explains the occurrence of the violet colour of the longtime annealed samples. The chemical shift analysis shows more ionic bond of Y–O than Al–O.

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