Crystal structure refinement of the ternary compound Cu2SnTe3 by X-ray powder diffraction by G. E. Delgado, A. J. Mora, G. Marcano, and C. Rincón

Crystal Research and Technology

Cryst. Res. Technol. 43, 433 (2008) - Abstract -

Crystal structure refinement of the ternary compound Cu₂SnTe₃ by X-ray powder diffraction

G. E. Delgado, A. J. Mora, G. Marcano*, and C. Rincón*

Laboratorio de Cristalografía, Departamento de Química, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela
*Centro de Estudios de Semiconductores, Departamento de Física, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela

Keywords	chalcogenide compound, crystal structure, X-ray powder diffraction, rietveld refinement
PACS	61.10.Nz, 61.50.Nw, 61.66.Fn
DOI	10.1002/crat.200711049

The ternary compound Cu₂SnTe₃ crystallizes in the Imm2 (Nº 44) space group, Z = 2, with a = 12.833(4) Å, b = 4.274(1) Å, c = 6.043(1) Å, V = 331.5(1) Å³. Its structure was refined from X-ray powder diffraction data using the Rietveld method. This compound is isostructural with Cu₂GeSe₃, and consists of a three-dimensional arrangement of slightly distorted CuTe₄ and SnTe₄ tetrahedra connected by common corners.

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