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Contents

	Dirk C. Meyer: Biography of Prof. Dr. Peter Paufler	3
	Original Papers
	P. Rudolph: Dislocation cell structures in melt-grown semiconductor compound crystals	7
	G. Behr, W. Löser, M.-O. Apostu, W. Gruner, M. Hücker, L. Schramm1, D. Souptel, A. Teresiak, and J. Werner: Floating zone growth of CuO under elevated oxygen pressure and its relevance for the crystal growth of cuprates	21
	E. Sani, M. Rabe, G. Reck, P. Becker, M. Roßberg, R. Bertram, and D. Klimm: Growth and characterization of LiCaGaF6	26
	C. Blochwitz and W. Tirschler: Twin boundaries as crack nucleation sites	32
	A. Kupsch, A. A. Levin, and D. C. Meyer : Structural phase transition in Tb5(Si0.6Ge0.4)4 at low temperature	42
	V. Geist, G. Wagner, G. Nolze and O. Moretzki: Investigations of the meteoritic mineral (Fe,Ni)3P	52
	S. Filatov, R. Bubnova, Yu. Shepelev, J. Anderson, and Yu. Smolin: The crystal structure of high-temperature α-CsB5O8 modification at 20, 300, and 500°C	65
	R. S. Bubnova, M. G. Krzhizhanovskaya, I. G. Polyakova, and S. K. Filatov: In situ high-temperature X-ray diffraction study of the Rb2O-B2O3 glass forming system	73
	C.-G. Oertel, R. Tamm, W. Skrotzki, and H.-G. Brokmeier: Anomalous creep behaviour of aluminium high current joint materials	83
	W. Skrotzki, K. Kegler, R. Tamm, and C.-G. Oertel: Grain structure and texture of cast iron aluminides	90
	T. Leisegang, A. A. Levin, J. Walter, and D. C. Meyer: In situ X-ray analysis of MoO3 reduction	95
	A. Gorbunov, A. A. Levin, D. C. Meyer, L. Bischoff, D. Eckert, B. Köhler, M. Mertig, T. Weiβbach, E. Wieser, and W. Pompe: Correlation of structural and physical properties of metastable Fe-Cr phases	106
	E. Gutmann, A. A. Levin, I. Pommrich, and D. C. Meyer: Preparation of aluminosilicate crystalline coatings from sol-gel derived alumina films deposited on silicon/silica substrates	114
	D. C. Meyer, A. Gorbunov, W. Pompe, and A. A. Levin: Formation of diffusion-hindering interlayers in metals in contact by dedicated thermal treatment	125
	R. Hübner, R. Reiche, M. Hecker, N. Mattern, V. Hoffmann, K. Wetzig, H. Heuer, Ch. Wenzel, H.-J. Engelmann, and E. Zschech: Void formation in the Cu layer during thermal treatment of SiNx/Cu/Ta73Si27/SiO2/Si systems	135
	R. Krawietz, B. Kämpfe, E. Auerswald, and M. Brücher: Raman spectroscopic and X-ray investigation of stressed states in diamond-like carbon films	143
	M. Lehmann and H. Lichte: Electron holographic material analysis at atomic dimensions	149
	A. Schneidewind, A. Kreyssig, and M. Loewenhaupt: Magnetic X-ray scattering and the example of the investigation of RCu2 compounds (R = rare earth)	161
	E. Estevez-Rams, A. Penton, J. Martinez-Garcia, and H. Fuess: The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals	166
	J. Müller, P. Löthman, and D. C. Meyer: Small angle X-ray transmission characterisation of nanometer-sized Pt-clusters in a ceramic thin film on metal substrate	177
	F. Friedel, U. Winkler, B. Holtz, R. Seyrich, and H.-J. Ullrich: Material analysis with X-ray microdiffraction	182