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R. Köhler, W. Neumann: Preface
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637
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Hans Bradaczek: Gerhard Hildebrandt - born 30 May 1922
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639
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Original Papers
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M. S. Goorsky, B. K. Tanner: Grazing Incidence In-plane Diffraction Measurement of In-plane Mosaic with Microfocus X-ray Tubes
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645
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C. Malgrange: X-ray Propagation in Distorted Crystals: From Dynamical to Kinematical Theory
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654
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H.-R. Höche, M. Kolbe, Ch. Eisenschmidt: Change of the X-Ray Polarisation State by Diffraction
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665
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Y. Epelboin, B. Capelle: Analysis of the Contrast of Piezoelectric Devices in Synchrotron Stroboscopic Section Topographs
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676
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|
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A. Erko, N. V. Abrosimov, V. Alex: Laterally-Graded SiGe Crystals for High Resolution Synchrotron Optics
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685
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|
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J. Härtwig, S. Köhler, W. Ludwig, H. Moriceau, M. Ohler, E. Prieur: X-ray Diffraction Topography at a Synchrotron Radiation Source Applied to the Study of Bonded Silicon on Insulator Material
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705
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H. Berger: Simulation of X-Ray Reflection Curves in Single Non-Coplanar Geometry and Its Application
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716
|
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W. Treimer, M. Strobl, A. Hilger: Observation of Edge Diffraction with a Double Crystal Diffractometer
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727
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R. Köhler, P. Schäfer: Asymmetric Bragg Reflection as Magnifying Optics
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734
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H. Klapper, R. A. Becker, D. Schmiemann, A. Faber: Growth-Sector Boundaries and Growth-Rate Dispersion in Potassium Alum Crystals
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747
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S. Lagomarsino, A. Cedola, S. Di Fonzo, W. Jark, V. Mocella, J. B. Pelka, C. Riekel: Advances in Microdiffraction with X-Ray Waveguide
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758
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T. Geue, O. Henneberg, U. Pietsch: X-ray Reflectivity from Sinusoidal Surface Relief Gratings
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770
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G. Hildebrandt: How Discoveries are Made – or Some Remarks on the Discovery of the Borrmann Effect
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777
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