Crystal Research and Technology

Volume 44
2009
Number 10

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Graphical presentation of the papers in this issue

1009
 

Special Issue dedicated to Prof. W. Neumann on the occasion of his 65th birthday

Issue Editors: K.-W. Benz and K. Sangwal


Contents

K.-W. Benz: Preface

1015
 
K. Scheerschmidt: Personal reflections

1017
 

Reviews

K. Sangwal: Indentation size effect, indentation cracks and microhardness measurement of brittle crystalline solids - some basic concepts and trends

1019
 
S. Krukowski, P. Kempisty, and P. Strak: GaN growth by ammonia based methods – density functional theory study

1038
 

Original Papers

H. Kirmse, I. Häusler, S. Kret, E. Janik, G. Karczewski, and T. Wojtowicz: TEM analysis of the container effect of Au-based catalyst droplets during vapour-liquid-solid growth of axial ZnTe/CdTe nanowires

1047
 
V. Babentsov, J. Franc, P. Höschl, M. Fiederle, K. W. Benz, N. V. Sochinskii, E. Dieguez, and R. B. James: Characterization of compensation and trapping in CdTe and CdZnTe: Recent advances

1054
 
M. Fiederle, K. W. Benz, A. Cröll, A. Zappettini, D. Calestani, E. Dieguez, L. Carotenuto, and E. Bassano: Deposition of CdTe films under microgravity: Foton M3 mission

1059
 
H. Kirmse, F.-M. Kiessling, I. Häusler, and P. Rudolph: TEM investigation of precipitates in VCz GaAs crystals

1067
 
D. Gogova, M. Albrecht, T. Remmele, K. Irmscher, D. Siche, H.-J. Rost, M. Schmidbauer, R. Fornari, and R. Yakimova: Microscopic lateral overgrowth by physical vapour transport of GaN on self-organized diamond-like carbon masks

1078
 
H. Blank, D. Litvinov, R. Schneider, D. Gerthsen, T. Passow, and K. Scheerschmidt: Quantification of the In-distribution in embedded InGaAs quantum dots by transmission electron microscopy

1083
 
A. Wierzbicka, J. Z. Domagala, M. Sarzynski, and Z. R. Zytkiewicz: Spatially resolved X-ray diffraction as a tool for strain analysis in laterally modulated epitaxial structures

1089
 
N. Zakharov, E. Pippel, P. Werner, V. Vdovin, and U. Gösele: Oxide layer dissolution in Si/SiOx/Si wafer bonded structures

1095
 
A. Cröll, A. Mitric, O. Aniol, S. Schütt, and P. Simon: Solutocapillary convection in germanium-silicon melts

1101
 
A. N. Danilewsky, A. Cröll, J. Tonn, M. Schweizer, S. Lauer, K. W. Benz, T. Tuomi, R. Rantamäki, P. McNally, and J. Curley: Dislocations and dislocation reduction in space grown GaSb

1109
 
R. Schneider, B. Freitag, D. Gerthsen, K. S. Ilin, and M. Siegel: Structural, microchemical and superconducting properties of ultrathin NbN films on silicon

1115
 
W. Depmeier: Minerals as advanced materials

1122
 
L. Bohatý and P. Becker: Optical properties of non-centrosymmetric mixed crystals K2(La1-xCex)(NO3)5 . 2 H2O (x = 0.0 – 1.0)

1131
 
M. Reibold, N. Pätzke A. A. Levin, W. Kochmann, I. P. Shakhverdova, P. Paufler, and D. C. Meyer: Structure of several historic blades at nanoscale

1139
 
J. Huang, H. P. Strunk, W. Wasserbäch, and S. Franz: Internally oxidized silver contact materials– a case for the elastoplasticity of an inhomogeneous body

1147
 
M. Burianek, M. Mühlberg, M. Woll, M. Schmücker, Th. M. Gesing, and H. Schneider: Single-crystal growth and characterization of mullite-type orthorhombic Bi2M4O9 (M = Al3+, Ga3+, Fe3+)

1156
 
J. Dutkiewicz, L. Litynska, W. Maziarz, K. Haberko, W. Pyda, and A. Kanciruk: Structure and properties of nanocomposites prepared from ball milled 6061aluminium alloy with ZrO2 nanoparticles

1163
 
G. P. Dimitrakopulos, E. Kalesaki, Ph. Komninou, Th. Kehagias, J. Kioseoglou, and Th. Karakostas: Strain accommodation and interfacial structure of AlN interlayers in GaN

1170