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K.-W. Benz: Preface
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1015
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K. Scheerschmidt: Personal reflections
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1017
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Reviews
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K. Sangwal: Indentation size effect, indentation cracks and microhardness measurement of brittle crystalline solids - some basic concepts and trends
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1019 |
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S. Krukowski, P. Kempisty, and P. Strak: GaN growth by ammonia based methods – density functional theory study
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1038 |
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Original Papers
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H. Kirmse, I. Häusler, S. Kret, E. Janik, G. Karczewski, and T. Wojtowicz: TEM analysis of the container effect of Au-based catalyst droplets during vapour-liquid-solid growth of axial ZnTe/CdTe nanowires
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1047 |
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V. Babentsov, J. Franc, P. Höschl, M. Fiederle, K. W. Benz, N. V. Sochinskii, E. Dieguez, and R. B. James: Characterization of compensation and trapping in CdTe and CdZnTe: Recent advances
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1054 |
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M. Fiederle, K. W. Benz, A. Cröll, A. Zappettini, D. Calestani, E. Dieguez, L. Carotenuto, and E. Bassano: Deposition of CdTe films under microgravity: Foton M3 mission
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1059 |
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H. Kirmse, F.-M. Kiessling, I. Häusler, and P. Rudolph: TEM investigation of precipitates in VCz GaAs crystals
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1067 |
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D. Gogova, M. Albrecht, T. Remmele, K. Irmscher, D. Siche, H.-J. Rost, M. Schmidbauer, R. Fornari, and R. Yakimova: Microscopic lateral overgrowth by physical vapour transport of GaN on self-organized diamond-like carbon masks
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1078 |
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H. Blank, D. Litvinov, R. Schneider, D. Gerthsen, T. Passow, and K. Scheerschmidt: Quantification of the In-distribution in embedded InGaAs quantum dots by transmission electron microscopy
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1083 |
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A. Wierzbicka, J. Z. Domagala, M. Sarzynski, and Z. R. Zytkiewicz: Spatially resolved X-ray diffraction as a tool for strain analysis in laterally modulated epitaxial structures
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1089 |
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N. Zakharov, E. Pippel, P. Werner, V. Vdovin, and U. Gösele: Oxide layer dissolution in Si/SiOx/Si wafer bonded structures
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1095 |
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A. Cröll, A. Mitric, O. Aniol, S. Schütt, and P. Simon: Solutocapillary convection in germanium-silicon melts
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1101 |
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A. N. Danilewsky, A. Cröll, J. Tonn, M. Schweizer, S. Lauer, K. W. Benz, T. Tuomi, R. Rantamäki, P. McNally, and J. Curley: Dislocations and dislocation reduction in space grown GaSb
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1109 |
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R. Schneider, B. Freitag, D. Gerthsen, K. S. Ilin, and M. Siegel: Structural, microchemical and superconducting properties of ultrathin NbN films on silicon
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1115 |
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W. Depmeier: Minerals as advanced materials
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1122 |
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L. Bohatý and P. Becker: Optical properties of non-centrosymmetric mixed crystals K2(La1-xCex)(NO3)5 . 2 H2O (x = 0.0 – 1.0)
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1131 |
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M. Reibold, N. Pätzke A. A. Levin, W. Kochmann, I. P. Shakhverdova, P. Paufler, and D. C. Meyer: Structure of several historic blades at nanoscale
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1139 |
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J. Huang, H. P. Strunk, W. Wasserbäch, and S. Franz: Internally oxidized silver contact materials– a case for the elastoplasticity of an inhomogeneous body
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1147 |
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M. Burianek, M. Mühlberg, M. Woll, M. Schmücker, Th. M. Gesing, and H. Schneider: Single-crystal growth and characterization of mullite-type orthorhombic Bi2M4O9 (M = Al3+, Ga3+, Fe3+)
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1156 |
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J. Dutkiewicz, L. Litynska, W. Maziarz, K. Haberko, W. Pyda, and A. Kanciruk: Structure and properties of nanocomposites prepared from ball milled 6061aluminium alloy with ZrO2 nanoparticles
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1163 |
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G. P. Dimitrakopulos, E. Kalesaki, Ph. Komninou, Th. Kehagias, J. Kioseoglou, and Th. Karakostas: Strain accommodation and interfacial structure of AlN interlayers in GaN
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1170 |