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This issue contains papers dedicated to Professor Johannes Heydenreich on the occasion of his 70th birthday.
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Preface
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639
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Original Papers
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D. Hesse, N. D. Zakharov, A. Pignolet, A. R. James, S. Senz:
TEM Cross-Section Investigations of Epitaxial Ba2Bi4Ti5O18 Thin Films on LaNiO3 Bottom Electrodes on CeO2/YSZ-Buffered Si(100)
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641
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J. Woltersdorf, A. Feldhoff, O. Lichtenberger:
The Complex Bonding of Titanium Nitride Layers in C/Mg Composites Revealed by ELNES Features
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653
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A. Hähnel, E. Pippel, J. Woltersdorf:
Nanoprocesses of the Formation of Reaction Layers in Si-C-O Systems
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663
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B. Rauschenbach, J. W. Gerlach:
Texture Development in Titanium Nitride Films Grown by Low-Energy Ion Assisted Deposition
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675
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J. Zweck, R. Trautsch:
Magnetically Induced Changes in the Physical Microstructure of Anisotropic Amorphous FeTb Alloys
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689
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G. Radnóczi, P.B. Barna, M. Adamik, Zs. Czigány, J.Ariake, N Honda, K. Ouchi:
Growth Structure of Thin Films for Perpendicular Magnetic Recording Media
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707
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N. D. Zakharov, P. Werner, I. P. Zibrov, V.P. Filonenko, M. Sundberg:
Structural Studies of Calcium Tungsten Bronzes, CaxWO3, Formed at High Pressure
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713
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A. Buerke, H. Wendrock, K. Wetzig:
Study of Electromigration Damage in Al Interconnect Lines inside a SEM
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721
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J. Urban, H. Sack-Kongehl, K. Weiss, I. Lisiecki, M.-P. Pileni:
Structures of Clusters
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731
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S. A. Nepijko, M. Klimenkov, H. Kuhlenbeck, H.-J. Freund:
Local Melting of the NiAl Substrate Under Deposited Pd Clusters During Irradiation in a Transmission Electron Microscope
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745
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K. M. Knowles, S. Turan:
High Resolution Transmission Electron Microscopy of Grain Boundaries between Hexagonal Boron Nitride Grains in Si3N4–SiC Particulate Composites
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751
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P. Werner, K. Scheerschmidt, N. D. Zakharov, R. Hillebrand, M. Grundmann, R. Schneider:
Quantum Dot Structures in the InGaAs System Investigated by TEM Techniques
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759
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T. Marek, M. Werner, P. Lavéant, G. Gerth, P. Werner:
Dislocation Structures in Si:C Films : Generating "Plateau-Like" Surface Defects?
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769
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L. Fedina, A. Gutakovskii, A. Aseev:
In Situ HREM Irradiation Study of an Intrinsic Point Defects Clustering in FZ-Si
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775
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A. Hasse, K. Volz, A. K. Schaper, J. Koch, F. Höhnsdorf, W. Stolz:
TEM Investigations of (GaIn)(NAs)/GaAs Multi-Quantum Wells grown by MOVPE
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787
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A. Trampert, K. H. Ploog:
Heteroepitaxy of Large-Misfit Systems: Role of Coincidence Lattice
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793
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M. Reiche, U. Gösele, M. Wiegand:
Modification of Si(100)-Surfaces by SF6 Plasma Etching – Application to Wafer Direct Bonding
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807
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A.-T. Tham, D. S. Su, W. Neumann, P. Schubert-Bischoff, C. Beilharz, K. W. Benz:
Transmission Electron Microscopy Study of CuIn3Se5
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823
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I. Hähnert, A. Knauer, R. Schneider, I. Rechenberg, A. Klein, W. Neumann:
{110} and {111} Ordering in MOVPE-grown (Ga,In)P on (001) GaAs Substrates at Low Temperature
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831
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J. Thomas, H.-D. Bauer, S. Baunack, K. Wetzig:
Investigations on Nanoscale Multilayers by Analytical TEM in Scanning Mode
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839
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R. A. Schwarzer, A. Huot:
The Study of Microstructure on a Mesoscale by ACOM
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851
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G. H. Michler, R. Godehardt:
Deformation Mechanisms of Semi-Crystalline Polymers on the Submicron Scale
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863
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M. Heinze, R. Reichelt, S. Kleff, R. Eising:
High Resolution Scanning Electron Microscopy of Protein Inclusions (Cores) purified from Peroxisomes of Sunflower (Helianthus annuus L.) Cotyledons
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877
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H. Lichte:
Are Ferroelectric Crystals Blaze-Gratings for Electrons?
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887
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M. Albrecht, S. B. Aldabergenova, Sh. B. Baiganatova, G. Frank, T. I. Taurbaev, S. Christiansen, H. P. Strunk:
Carbon Containing Platelets in Silicon and Oriented Diamond Growth
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899
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Book Review |
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Harry H. Binder: Lexikon der chemischen Elemente; Das Periodensystem in Fakten, Zahlen und Daten (K. W. Benz)
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907
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J. J. Rousseau: Basic Crystallography (A. N. Danilewsky)
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908
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